Determination of the surface potential and isoelectric point of wafers with a zeta potential analyzer from DataPhysics
Resource type:
Application note
Format:
pdf
Date of creation:
2 January 2024
Library code:
13587
In this application note, the zeta potential ζ and the isoelectric point of recently cleaned and activated oxidised silicon wafers (SiO2 -wafers) as well as silicon wafers coated with a thin aminopropylsilane layer (SiO2 -APS-wafers) were determined using the ZPA 20 from DataPhysics and the streaming current method.
