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Measurement of protein in heavy water by FT-IR
This application note demonstrates FT/IR measurements of several types of protein in heavy water.

Microscopic ATR measurement of thin polyimide film on silicon substrates
This application note shows an example of measuring a thin polyimide film on a silicon substrate using the micro-ATR method.

Evaluation of Si Wafer surface condition using 65-degree incident ATR PRO650G
This application note shows an evaluation of Si Wafer surface condition using the 65-degree incident ATR PRO650G attachment.

Multiple components analysis by PCA mapping with an IR microscope
This report shows some examples of analysis by PCA mapping which enables easier analysis of component distribution from mapping data.

Silicon wafer analysis using a full vacuum FT/IR spectrometer
A spectrum of a silicon wafer without any noise influence due to water vapor can be obtained easily when the optical system is in vacuum condition.

Simultaneous monitoring analysis of multicomponent gas in the atmosphere by FTIR using CLS automatic quantitation
CLS (Classical Least Square) quantitation is one of the multivariate analyses and calculates quantitatively using all spectral data in the varying area depending on concentration. Therefore, it is an efficient quantitation method in case that it is difficult to find a single peak for quantitation because of overlaid spectra of multicomponent, and simultaneous quantitation of multicomponent is required.

FTIR accessories for polarized reflection measurement
Jasco introduces the features and specs for their polarized reflection measurement instruments RAS-300(built-in polarizing mirror model)/H and RAS-310/H(wire grid polarizer model). These instruments are intended for measuring general thin organic films on metal.

Chemical resistance of the single-reflection and multi-reflection ATR PRO400 FTIR accessories
This technical note introduces the factors to be taken into consideration when selecting a prism for the ATR attachments.

Grazing angle reflection attachment for FTIR spectrometers
The Jasco RAS-500 grazing angle reflection attachment employs a reflective Cassegrain mirror, enabling the measurement of large samples because it is possible to make measurements simply by placing a sample on the XY stage.

Simple methods to measure powder samples by FT/IR
This technical note describes a new procedure enabling to obtain good spectra without the need of some sample preparation or the use of an attachment.

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