Norlab

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Silicon wafer analysis using a full vacuum FT/IR spectrometer
A spectrum of a silicon wafer without any noise influence due to water vapor can be obtained easily when the optical system is in vacuum condition.

Simultaneous monitoring analysis of multicomponent gas in the atmosphere by FTIR using CLS automatic quantitation
CLS (Classical Least Square) quantitation is one of the multivariate analyses and calculates quantitatively using all spectral data in the varying area depending on concentration. Therefore, it is an efficient quantitation method in case that it is difficult to find a single peak for quantitation because of overlaid spectra of multicomponent, and simultaneous quantitation of multicomponent is required.

FTIR accessories for polarized reflection measurement
Jasco introduces the features and specs for their polarized reflection measurement instruments RAS-300(built-in polarizing mirror model)/H and RAS-310/H(wire grid polarizer model). These instruments are intended for measuring general thin organic films on metal.

Chemical resistance of the single-reflection and multi-reflection ATR PRO400 FTIR accessories
This technical note introduces the factors to be taken into consideration when selecting a prism for the ATR attachments.

Grazing angle reflection attachment for FTIR spectrometers
The Jasco RAS-500 grazing angle reflection attachment employs a reflective Cassegrain mirror, enabling the measurement of large samples because it is possible to make measurements simply by placing a sample on the XY stage.

Simple methods to measure powder samples by FT/IR
This technical note describes a new procedure enabling to obtain good spectra without the need of some sample preparation or the use of an attachment.

Variable-angle transmittance measurement attachment with polarizer option
This technical note introduces the Jasco VAT-500i Variable-angle transmittance measurement attachment.

Elimination of interference curve from PP spectrum
Jasco introduces optional software that eliminates interference patterns for its FTIR series (Wave Function, FFT filter).

Time course mapping measurement using multiple points mapping measurement program and 3D mapping data analysis program
In this technical note, utilizing Jasco’s highest speed multiple channel IR microscope system IRT-7000 system capable of measurements with 160 points/sec as maximum, a time course mapping measurement was executed to monitor the hardening process of UV curing resins.

How to properly analyze the 3D spectral data obtained with interval scan mode
In this technical note, Jasco demonstrates how to properly analyze the 3D spectral data obtained with interval scan mode, using two dimensional correlation program.

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