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PIKE Technologies polarizers for FTIR spectrometers
Polarizers may be used to detect oriented samples and for measurement of thin films on reflective substrates.

PIKE Technologies specular reflectance sampling accessories for FTIR
Specular reflectance sampling represents a very important technique useful for the measurement of thin films on reflective substrates, the analysis of bulk materials and the measurement of mono-molecular layers on a substrate material.

PIKE Technologies Diffuse reflectance accessories for FTIR
Diffuse reflectance is a highly sensitive technique for the analysis of powdered and solid samples.

PIKE Technologies Attenuated Total Reflectance (ATR) accessories for IR sampling
ATR products successfully replace constant-path transmission cells and salt plates used for analysis of liquid and semi-liquid materials.

PIKE Technologies FTIR sampling kits
The kits are carefully designed to include all necessary components.

Efficacy of imaging data analysis using Model Analysis
This report illustrates an example of the imaging data analysis using Model Analysis in Micro Imaging Analysis program newly developed for IRT-5200/7100/7200. The Model Analysis is one of the functions to assist the analysis in the Micro Imaging Analysis program such as making an image without checking the spectrum.

The simple measurement method of liquid sample in near-IR region
In this note, Jasco introduces the simple measurement method by using the test tube with cell cap or easily washable laboratory dish, the portable type near-IR detected instrument VIR-9650 was used.

Measurement reproducibility of Color Diagnosis System
Jasco has developed various applications that use the V-700 Series of UV/Vis spectrophotometers for color analysis using both reflectance and/or transmittance spectra of samples. The V-700 spectrophotometer uses a double-beam optical system, which offers high measurement accuracy and stability. Because of the high performance of the V-700 UV/Vis spectrophotometer color coordinates (results for color calculation) can be determined with high reproducibility.

Reducing the noise due to water vapor and carbon dioxide by Sample shuttle, and the combination of Purge and Vacuum and Interval program
In this application note, Jasco introduces a couple measurement tips of Shuttle measurement and Purge and evacuation.

Fluorescence Observation, Polarization Observation and Differential Interference Observation methods are useful optional observation function
These methods are presented in this technical note.

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